Thin-film Thickness Measurements Systems: |
| The systems are general-purpose film thickness measurement instruments, and are used in thousands of applications worldwide with hi-tech, high precision and high stability because all the parts are all from famous companies and assemble in Taiwan at last. It just needs several minutes to connect the system to your computer and set up software, and the thickness and refractive index can be measured in less than a second. |
| Working Principle:The incident light of a light source will be emitted by one light fibre vertically to the coated sample. The reflected light will be collected by another light fibre, too.The thickness can be get after FFT calculation. |
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| Material: We can measure all at-least-partially-transparent films. The measured film must be at least somewhat shiny in appearance. |
| Thickness range: We can measure film thickness from 100nm to 1mm. Refractive index can be measured for films 70nm to 10¦Ìm thick. |
| Number of layers: We can usually measure up to five individual films in a stack. In some circumstances we can measure dozens of layers. |
| Classification |
| >Off-line It is easy to operate, customer can connect and setup software with our operation manual. |
| >On-line We can design, assemble and adjust customerized system according to different requirement. |
| Advantages |
| 1¡¢Save 15%-20% cost 2¡¢Compacted constructure can save much space 3¡¢Non-contact type avoid Scratching the film 4¡¢Easy operate because of Refractive Index Database: Our software contains refractive index data of common materials. The data comes from a variety of sources, including published works (cited) and index values measured by us. 5¡¢Many years of experience confirms the trustworthiness and reliability system performance. |
| Send Us a Sample for Free Refractive Index Measurement |
| If your material isn¡¯t listed in our database, pls contact us, we will measure it for you in 1-2 days after we get your samples. There is no charge for this service. Substrate kits for depositing films for refractive index measurement are also available. |
| Required information: We must know the ordering, identity, and nominal thickness of all films present, whether they are to be measured or not. |
| Changchun Worldhawk |
| Optoelectronics Co., Ltd. |
| No.3188 Yangpu Street, |
| Changchun, JiLin,China |
| www.worldhawk.com |
| Tel: +86-431-89825768 |
| Fax: +86-431-89825768 |
| Email:sales@worldhawk.com |
